Selective area deposited blue GaN-InGaN multiple-quantum well light emitting diodes over silicon substrates
Identifieur interne : 012447 ( Main/Repository ); précédent : 012446; suivant : 012448Selective area deposited blue GaN-InGaN multiple-quantum well light emitting diodes over silicon substrates
Auteurs : RBID : Pascal:00-0030461Descripteurs français
- Pascal (Inist)
- 8560J, 8105E, 6865, 8530V, 8115H, 8115G, 8115K, 8540H, Etude expérimentale, Gallium composé, Indium composé, Semiconducteur III-V, Semiconducteur bande interdite large, Puits quantique semiconducteur, Superréseau semiconducteur, Diode électroluminescente, Epitaxie jet moléculaire, Méthode MOCVD, Croissance semiconducteur, Masque.
English descriptors
- KwdEn :
Abstract
We report on fabrication and characterization of blue GaN-InGaN multi-quantum well (MQW) light-emitting diodes (LEDs) over (111) silicon substrates. Device epilayers were fabricated using unique combination of molecular beam epitaxy and low-pressure metalorganic chemical vapor deposition growth procedure in selective areas defined by openings in a SiO2 mask over the substrates. This selective area deposition procedure in principle can produce multicolor devices using a very simple fabrication procedure. The LEDs had a peak emission wavelength of 465 nm with a full width at half maximum of 40 nm. We also present the spectral emission data with the diodes operating up to 250°C. The peak emission wavelengths are measured as a function of both dc and pulse bias current and plate temperature to estimate the thermal impedance. © 2000 American Institute of Physics.
Links toward previous steps (curation, corpus...)
- to stream Main, to step Corpus: 013E22
Links to Exploration step
Pascal:00-0030461Le document en format XML
<record><TEI><teiHeader><fileDesc><titleStmt><title xml:lang="en" level="a">Selective area deposited blue GaN-InGaN multiple-quantum well light emitting diodes over silicon substrates</title>
<author><name sortKey="Yang, J W" uniqKey="Yang J">J. W. Yang</name>
<affiliation wicri:level="2"><inist:fA14 i1="01"><s1>Department of Electrical and Computer Engineering, University of South Carolina, Columbia, South Carolina 29028</s1>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
<sZ>7 aut.</sZ>
<sZ>8 aut.</sZ>
</inist:fA14>
<country xml:lang="fr">États-Unis</country>
<placeName><region type="state">Caroline du Sud</region>
</placeName>
<wicri:cityArea>Department of Electrical and Computer Engineering, University of South Carolina, Columbia</wicri:cityArea>
</affiliation>
<affiliation wicri:level="2"><inist:fA14 i1="02"><s1>Materials and Manufacturing Directorate, AFRL/MLPA Bldg. 620, 2241 Avionics Circle, Ste. 21, Wright-Patterson AFB, Ohio 45433</s1>
</inist:fA14>
<country xml:lang="fr">États-Unis</country>
<placeName><region type="state">Ohio</region>
</placeName>
<wicri:cityArea>Materials and Manufacturing Directorate, AFRL/MLPA Bldg. 620, 2241 Avionics Circle, Ste. 21, Wright-Patterson AFB</wicri:cityArea>
</affiliation>
<affiliation wicri:level="2"><inist:fA14 i1="03"><s1>Sensor Electronic Technology, Inc., Troy, New York 12180</s1>
</inist:fA14>
<country xml:lang="fr">États-Unis</country>
<placeName><region type="state">État de New York</region>
</placeName>
<wicri:cityArea>Sensor Electronic Technology, Inc., Troy</wicri:cityArea>
</affiliation>
</author>
<author><name sortKey="Lunev, A" uniqKey="Lunev A">A. Lunev</name>
<affiliation wicri:level="2"><inist:fA14 i1="01"><s1>Department of Electrical and Computer Engineering, University of South Carolina, Columbia, South Carolina 29028</s1>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
<sZ>7 aut.</sZ>
<sZ>8 aut.</sZ>
</inist:fA14>
<country xml:lang="fr">États-Unis</country>
<placeName><region type="state">Caroline du Sud</region>
</placeName>
<wicri:cityArea>Department of Electrical and Computer Engineering, University of South Carolina, Columbia</wicri:cityArea>
</affiliation>
</author>
<author><name sortKey="Simin, G" uniqKey="Simin G">G. Simin</name>
<affiliation wicri:level="2"><inist:fA14 i1="01"><s1>Department of Electrical and Computer Engineering, University of South Carolina, Columbia, South Carolina 29028</s1>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
<sZ>7 aut.</sZ>
<sZ>8 aut.</sZ>
</inist:fA14>
<country xml:lang="fr">États-Unis</country>
<placeName><region type="state">Caroline du Sud</region>
</placeName>
<wicri:cityArea>Department of Electrical and Computer Engineering, University of South Carolina, Columbia</wicri:cityArea>
</affiliation>
</author>
<author><name sortKey="Chitnis, A" uniqKey="Chitnis A">A. Chitnis</name>
<affiliation wicri:level="2"><inist:fA14 i1="01"><s1>Department of Electrical and Computer Engineering, University of South Carolina, Columbia, South Carolina 29028</s1>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
<sZ>7 aut.</sZ>
<sZ>8 aut.</sZ>
</inist:fA14>
<country xml:lang="fr">États-Unis</country>
<placeName><region type="state">Caroline du Sud</region>
</placeName>
<wicri:cityArea>Department of Electrical and Computer Engineering, University of South Carolina, Columbia</wicri:cityArea>
</affiliation>
</author>
<author><name sortKey="Shatalov, M" uniqKey="Shatalov M">M. Shatalov</name>
<affiliation wicri:level="2"><inist:fA14 i1="01"><s1>Department of Electrical and Computer Engineering, University of South Carolina, Columbia, South Carolina 29028</s1>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
<sZ>7 aut.</sZ>
<sZ>8 aut.</sZ>
</inist:fA14>
<country xml:lang="fr">États-Unis</country>
<placeName><region type="state">Caroline du Sud</region>
</placeName>
<wicri:cityArea>Department of Electrical and Computer Engineering, University of South Carolina, Columbia</wicri:cityArea>
</affiliation>
</author>
<author><name sortKey="Khan, M Asif" uniqKey="Khan M">M. Asif Khan</name>
<affiliation wicri:level="2"><inist:fA14 i1="01"><s1>Department of Electrical and Computer Engineering, University of South Carolina, Columbia, South Carolina 29028</s1>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
<sZ>7 aut.</sZ>
<sZ>8 aut.</sZ>
</inist:fA14>
<country xml:lang="fr">États-Unis</country>
<placeName><region type="state">Caroline du Sud</region>
</placeName>
<wicri:cityArea>Department of Electrical and Computer Engineering, University of South Carolina, Columbia</wicri:cityArea>
</affiliation>
</author>
<author><name sortKey="Van Nostrand, Joseph E" uniqKey="Van Nostrand J">Joseph E. Van Nostrand</name>
<affiliation wicri:level="2"><inist:fA14 i1="01"><s1>Department of Electrical and Computer Engineering, University of South Carolina, Columbia, South Carolina 29028</s1>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
<sZ>7 aut.</sZ>
<sZ>8 aut.</sZ>
</inist:fA14>
<country xml:lang="fr">États-Unis</country>
<placeName><region type="state">Caroline du Sud</region>
</placeName>
<wicri:cityArea>Department of Electrical and Computer Engineering, University of South Carolina, Columbia</wicri:cityArea>
</affiliation>
</author>
<author><name sortKey="Gaska, R" uniqKey="Gaska R">R. Gaska</name>
<affiliation wicri:level="2"><inist:fA14 i1="01"><s1>Department of Electrical and Computer Engineering, University of South Carolina, Columbia, South Carolina 29028</s1>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
<sZ>7 aut.</sZ>
<sZ>8 aut.</sZ>
</inist:fA14>
<country xml:lang="fr">États-Unis</country>
<placeName><region type="state">Caroline du Sud</region>
</placeName>
<wicri:cityArea>Department of Electrical and Computer Engineering, University of South Carolina, Columbia</wicri:cityArea>
</affiliation>
</author>
</titleStmt>
<publicationStmt><idno type="inist">00-0030461</idno>
<date when="2000-01-17">2000-01-17</date>
<idno type="stanalyst">PASCAL 00-0030461 AIP</idno>
<idno type="RBID">Pascal:00-0030461</idno>
<idno type="wicri:Area/Main/Corpus">013E22</idno>
<idno type="wicri:Area/Main/Repository">012447</idno>
</publicationStmt>
<seriesStmt><idno type="ISSN">0003-6951</idno>
<title level="j" type="abbreviated">Appl. phys. lett.</title>
<title level="j" type="main">Applied physics letters</title>
</seriesStmt>
</fileDesc>
<profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Experimental study</term>
<term>Gallium compounds</term>
<term>III-V semiconductors</term>
<term>Indium compounds</term>
<term>Light emitting diodes</term>
<term>MOCVD</term>
<term>Masks</term>
<term>Molecular beam epitaxy</term>
<term>Semiconductor growth</term>
<term>Semiconductor quantum wells</term>
<term>Semiconductor superlattices</term>
<term>Wide band gap semiconductors</term>
<term>quantum well devices</term>
</keywords>
<keywords scheme="Pascal" xml:lang="fr"><term>8560J</term>
<term>8105E</term>
<term>6865</term>
<term>8530V</term>
<term>8115H</term>
<term>8115G</term>
<term>8115K</term>
<term>8540H</term>
<term>Etude expérimentale</term>
<term>Gallium composé</term>
<term>Indium composé</term>
<term>Semiconducteur III-V</term>
<term>Semiconducteur bande interdite large</term>
<term>Puits quantique semiconducteur</term>
<term>Superréseau semiconducteur</term>
<term>Diode électroluminescente</term>
<term>Epitaxie jet moléculaire</term>
<term>Méthode MOCVD</term>
<term>Croissance semiconducteur</term>
<term>Masque</term>
</keywords>
</textClass>
</profileDesc>
</teiHeader>
<front><div type="abstract" xml:lang="en">We report on fabrication and characterization of blue GaN-InGaN multi-quantum well (MQW) light-emitting diodes (LEDs) over (111) silicon substrates. Device epilayers were fabricated using unique combination of molecular beam epitaxy and low-pressure metalorganic chemical vapor deposition growth procedure in selective areas defined by openings in a SiO<sub>2</sub>
mask over the substrates. This selective area deposition procedure in principle can produce multicolor devices using a very simple fabrication procedure. The LEDs had a peak emission wavelength of 465 nm with a full width at half maximum of 40 nm. We also present the spectral emission data with the diodes operating up to 250°C. The peak emission wavelengths are measured as a function of both dc and pulse bias current and plate temperature to estimate the thermal impedance. © 2000 American Institute of Physics.</div>
</front>
</TEI>
<inist><standard h6="B"><pA><fA01 i1="01" i2="1"><s0>0003-6951</s0>
</fA01>
<fA02 i1="01"><s0>APPLAB</s0>
</fA02>
<fA03 i2="1"><s0>Appl. phys. lett.</s0>
</fA03>
<fA05><s2>76</s2>
</fA05>
<fA06><s2>3</s2>
</fA06>
<fA08 i1="01" i2="1" l="ENG"><s1>Selective area deposited blue GaN-InGaN multiple-quantum well light emitting diodes over silicon substrates</s1>
</fA08>
<fA11 i1="01" i2="1"><s1>YANG (J. W.)</s1>
</fA11>
<fA11 i1="02" i2="1"><s1>LUNEV (A.)</s1>
</fA11>
<fA11 i1="03" i2="1"><s1>SIMIN (G.)</s1>
</fA11>
<fA11 i1="04" i2="1"><s1>CHITNIS (A.)</s1>
</fA11>
<fA11 i1="05" i2="1"><s1>SHATALOV (M.)</s1>
</fA11>
<fA11 i1="06" i2="1"><s1>KHAN (M. Asif)</s1>
</fA11>
<fA11 i1="07" i2="1"><s1>VAN NOSTRAND (Joseph E.)</s1>
</fA11>
<fA11 i1="08" i2="1"><s1>GASKA (R.)</s1>
</fA11>
<fA14 i1="01"><s1>Department of Electrical and Computer Engineering, University of South Carolina, Columbia, South Carolina 29028</s1>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
<sZ>7 aut.</sZ>
<sZ>8 aut.</sZ>
</fA14>
<fA14 i1="02"><s1>Materials and Manufacturing Directorate, AFRL/MLPA Bldg. 620, 2241 Avionics Circle, Ste. 21, Wright-Patterson AFB, Ohio 45433</s1>
</fA14>
<fA14 i1="03"><s1>Sensor Electronic Technology, Inc., Troy, New York 12180</s1>
</fA14>
<fA20><s1>273-275</s1>
</fA20>
<fA21><s1>2000-01-17</s1>
</fA21>
<fA23 i1="01"><s0>ENG</s0>
</fA23>
<fA43 i1="01"><s1>INIST</s1>
<s2>10020</s2>
</fA43>
<fA44><s0>8100</s0>
<s1>© 2000 American Institute of Physics. All rights reserved.</s1>
</fA44>
<fA47 i1="01" i2="1"><s0>00-0030461</s0>
</fA47>
<fA60><s1>P</s1>
</fA60>
<fA61><s0>A</s0>
</fA61>
<fA64 i1="01" i2="1"><s0>Applied physics letters</s0>
</fA64>
<fA66 i1="01"><s0>USA</s0>
</fA66>
<fC01 i1="01" l="ENG"><s0>We report on fabrication and characterization of blue GaN-InGaN multi-quantum well (MQW) light-emitting diodes (LEDs) over (111) silicon substrates. Device epilayers were fabricated using unique combination of molecular beam epitaxy and low-pressure metalorganic chemical vapor deposition growth procedure in selective areas defined by openings in a SiO<sub>2</sub>
mask over the substrates. This selective area deposition procedure in principle can produce multicolor devices using a very simple fabrication procedure. The LEDs had a peak emission wavelength of 465 nm with a full width at half maximum of 40 nm. We also present the spectral emission data with the diodes operating up to 250°C. The peak emission wavelengths are measured as a function of both dc and pulse bias current and plate temperature to estimate the thermal impedance. © 2000 American Institute of Physics.</s0>
</fC01>
<fC02 i1="01" i2="X"><s0>001D03F15</s0>
</fC02>
<fC02 i1="02" i2="3"><s0>001B80A05H</s0>
</fC02>
<fC02 i1="03" i2="3"><s0>001B60H65</s0>
</fC02>
<fC02 i1="04" i2="X"><s0>001D03F20</s0>
</fC02>
<fC02 i1="05" i2="3"><s0>001B80A15H</s0>
</fC02>
<fC02 i1="06" i2="3"><s0>001B80A15G</s0>
</fC02>
<fC02 i1="07" i2="3"><s0>001B80A15K</s0>
</fC02>
<fC02 i1="08" i2="X"><s0>001D03F17</s0>
</fC02>
<fC03 i1="01" i2="3" l="FRE"><s0>8560J</s0>
<s2>PAC</s2>
<s4>INC</s4>
</fC03>
<fC03 i1="02" i2="3" l="FRE"><s0>8105E</s0>
<s2>PAC</s2>
<s4>INC</s4>
</fC03>
<fC03 i1="03" i2="3" l="FRE"><s0>6865</s0>
<s2>PAC</s2>
<s4>INC</s4>
</fC03>
<fC03 i1="04" i2="3" l="FRE"><s0>8530V</s0>
<s2>PAC</s2>
<s4>INC</s4>
</fC03>
<fC03 i1="05" i2="3" l="FRE"><s0>8115H</s0>
<s2>PAC</s2>
<s4>INC</s4>
</fC03>
<fC03 i1="06" i2="3" l="FRE"><s0>8115G</s0>
<s2>PAC</s2>
<s4>INC</s4>
</fC03>
<fC03 i1="07" i2="3" l="FRE"><s0>8115K</s0>
<s2>PAC</s2>
<s4>INC</s4>
</fC03>
<fC03 i1="08" i2="3" l="FRE"><s0>8540H</s0>
<s2>PAC</s2>
<s4>INC</s4>
</fC03>
<fC03 i1="09" i2="3" l="FRE"><s0>Etude expérimentale</s0>
</fC03>
<fC03 i1="09" i2="3" l="ENG"><s0>Experimental study</s0>
</fC03>
<fC03 i1="10" i2="3" l="FRE"><s0>Gallium composé</s0>
</fC03>
<fC03 i1="10" i2="3" l="ENG"><s0>Gallium compounds</s0>
</fC03>
<fC03 i1="11" i2="3" l="FRE"><s0>Indium composé</s0>
</fC03>
<fC03 i1="11" i2="3" l="ENG"><s0>Indium compounds</s0>
</fC03>
<fC03 i1="12" i2="3" l="FRE"><s0>Semiconducteur III-V</s0>
</fC03>
<fC03 i1="12" i2="3" l="ENG"><s0>III-V semiconductors</s0>
</fC03>
<fC03 i1="13" i2="3" l="FRE"><s0>Semiconducteur bande interdite large</s0>
</fC03>
<fC03 i1="13" i2="3" l="ENG"><s0>Wide band gap semiconductors</s0>
</fC03>
<fC03 i1="14" i2="3" l="FRE"><s0>Puits quantique semiconducteur</s0>
</fC03>
<fC03 i1="14" i2="3" l="ENG"><s0>Semiconductor quantum wells</s0>
</fC03>
<fC03 i1="15" i2="3" l="FRE"><s0>Superréseau semiconducteur</s0>
</fC03>
<fC03 i1="15" i2="3" l="ENG"><s0>Semiconductor superlattices</s0>
</fC03>
<fC03 i1="16" i2="3" l="FRE"><s0>Diode électroluminescente</s0>
</fC03>
<fC03 i1="16" i2="3" l="ENG"><s0>Light emitting diodes</s0>
</fC03>
<fC03 i1="17" i2="3" l="FRE"><s0>Epitaxie jet moléculaire</s0>
</fC03>
<fC03 i1="17" i2="3" l="ENG"><s0>Molecular beam epitaxy</s0>
</fC03>
<fC03 i1="18" i2="3" l="FRE"><s0>Méthode MOCVD</s0>
</fC03>
<fC03 i1="18" i2="3" l="ENG"><s0>MOCVD</s0>
</fC03>
<fC03 i1="19" i2="3" l="FRE"><s0>Croissance semiconducteur</s0>
</fC03>
<fC03 i1="19" i2="3" l="ENG"><s0>Semiconductor growth</s0>
</fC03>
<fC03 i1="20" i2="3" l="ENG"><s0>quantum well devices</s0>
<s4>INC</s4>
</fC03>
<fC03 i1="21" i2="3" l="FRE"><s0>Masque</s0>
</fC03>
<fC03 i1="21" i2="3" l="ENG"><s0>Masks</s0>
</fC03>
<fN21><s1>017</s1>
</fN21>
<fN47 i1="01" i2="1"><s0>0002M000086</s0>
</fN47>
</pA>
</standard>
</inist>
</record>
Pour manipuler ce document sous Unix (Dilib)
EXPLOR_STEP=IndiumV3/Data/Main/Repository
HfdSelect -h $EXPLOR_STEP/biblio.hfd -nk 012447 | SxmlIndent | more
Ou
HfdSelect -h $EXPLOR_AREA/Data/Main/Repository/biblio.hfd -nk 012447 | SxmlIndent | more
Pour mettre un lien sur cette page dans le réseau Wicri
{{Explor lien |wiki= *** parameter Area/wikiCode missing *** |area= IndiumV3 |flux= Main |étape= Repository |type= RBID |clé= Pascal:00-0030461 |texte= Selective area deposited blue GaN-InGaN multiple-quantum well light emitting diodes over silicon substrates }}
This area was generated with Dilib version V0.5.77. |